Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal.
By: Bushnell, Michael L. (Michael Lee).
Contributor(s): Agrawal, Vishwani D.
Material type:
BookSeries: Frontiers in electronic testing ; 17. Publisher: Boston : Kluwer Academic, c2000Description: xviii, 690 p. : ill. ; 24 cm.ISBN: 0792379918 .Subject(s): Integrated circuits -- Very large scale integration -- Testing | Digital integrated circuits -- Testing | Mixed signal circuits -- Testing | Semiconductor storage devices -- TestingDDC classification: 621.395
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Quinlivan Library, Notre Dame University Bangladesh CSE Shelf 02 Row 02 B | Non-fiction | 621.395 BUE (Browse shelf) | 01 | Not For Loan | 007302 | |
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Quinlivan Library, Notre Dame University Bangladesh CSE Shelf 02 Row 02 B | Non-fiction | 621.395 BUE (Browse shelf) | 02 | Available | 007303 | |
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Quinlivan Library, Notre Dame University Bangladesh CSE Shelf 02 Row 02 B | Non-fiction | 621.395 BUE (Browse shelf) | 03 | Available | 007304 |
Browsing Quinlivan Library, Notre Dame University Bangladesh Shelves , Shelving location: CSE Shelf 02 Row 02 B , Collection code: Non-fiction Close shelf browser
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| 621.384 KIW Wireless communications systems design / | 621.395 BUE Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / | 621.395 BUE Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / | 621.395 BUE Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / | 621.395 MAD Digital design : | 621.395 MAD Digital design : | 621.395 MAD Digital design : |
Includes bibliographical references and index.
CSE
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