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Bushnell, Michael L. 1950-

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal. - Boston : Kluwer Academic, c2000. - xviii, 690 p. : ill. ; 24 cm. - Frontiers in electronic testing ; 17 .

Includes bibliographical references and index.



0792379918

00046212


Integrated circuits--Very large scale integration--Testing.
Digital integrated circuits--Testing.
Mixed signal circuits--Testing.
Semiconductor storage devices--Testing.

621.395 / BUE
Last Updated on 5 July, 2022
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